Transmission Electron Microscopy and Diffractometry of Materials

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This book explains concepts of transmission electron microscopy TEM and x-ray diffractometry XRD that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM. This edition is not substantially longer than the second, but all chapters have been updated and revised for clarity.

A new chapter on high resolution STEM methods has been added.

Citations per year

The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail.

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Microcavities Oxford university press P. Vorlesung Allmandring 3 Semiarraum 0.

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Kristallwachstum und Fehlordnung in Kristallen 2. The edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM, and all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added.


  1. Citations per year.
  2. Transmission electron microscopy.
  3. Duplicate citations;
  4. Digital Control and Signal Processing Systems and Techniques.
  5. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. This book explains concepts of transmission electron microscopy TEM and x-ray diffractometry XRD that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM.

    This edition is not substantially longer than the second, but all chapters have been updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered.

    Transmission Electron Microscopy and Diffractometry of Materials

    The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. It is a superb book. Its integration of photons and electrons, beam lines and electron microscopes, theory and practice, assists students with diverse scientific and technical backgrounds to understand the essence of diffraction, spectrometry and imaging.

    Highly recommended.

    Additional material

    Explains the concepts of transmission electron microscopy TEM and x-ray diffractometry XRD that are useful for the characterization of materials. This book covers technical developments, including the improvement in resolution of the TEM.

    It is suitable for an introductory-level or advanced-level course. Convert currency. Add to Basket.